A New Approach to Determine Parameter Sensitivities of...

A New Approach to Determine Parameter Sensitivities of Transfer Lines

Y. C. Ho, M. A. Eyler and T. T. Chien
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Volume:
29
Language:
english
Journal:
Management Science
DOI:
10.2307/2631096
Date:
June, 1983
File:
PDF, 453 KB
english, 1983
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