Fiducial mark and nanocrack zone formation during thin-film...

Philosophical Magazine A 2002 / 11 Vol. 82; Iss. 17-18

Fiducial mark and nanocrack zone formation during thin-film delamination

Volinsky, Alex A., Moody, Neville R., Kottke, Michael L., Gerberich, William W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
82
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418610208240449
Date:
November, 2002
File:
PDF, 1.33 MB
english, 2002
Conversion to is in progress
Conversion to is failed