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A standardized non-instrumental tool for characterizing workstations concerned with exposure to engineered nanomaterials
I, Guseva Canu, C, Ducros, S, Ducamp, L, Delabre, S, Audignon-Durand, C, Durand, Y, Iwatsubo, D, Jezewski-Serra, O, Le Bihan, S, Malard, A, Radauceanu, M, Reynier, M, Ricaud, O, WitschgerVolume:
617
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/617/1/012036
Date:
May, 2015
File:
PDF, 923 KB
english, 2015