SPIE Proceedings [SPIE Optical Sensing for Environmental...

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SPIE Proceedings [SPIE Optical Sensing for Environmental and Process Monitoring - McLean, VA (Sunday 6 November 1994)] Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements - Offset scanning and field widening: maintaining the radiometric performance of a Fourier transform spectrometer (FTS) with high spectral discrimination capability

Engel, James R., Dorval, Rick K., Leonelli, Joseph, Killinger, Dennis K., Vaughan, William, Yost, Michael G.
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Volume:
2366
Year:
1995
Language:
english
DOI:
10.1117/12.205559
File:
PDF, 268 KB
english, 1995
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