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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray and Ultraviolet Spectroscopy and Polarimetry II - Hard x-ray polarimetry exploiting directional information of the photoeffect in a charge coupled device
Kotthaus, Rainer, Buschhorn, Gerd W., Rzepka, Matthias, Schmidt, Klaus H., Weinmann, Peter M., Fineschi, SilvanoVolume:
3443
Year:
1998
Language:
english
DOI:
10.1117/12.333604
File:
PDF, 749 KB
english, 1998