SPIE Proceedings [SPIE SPIE Advanced Lithography - San...

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SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Study of various RET for process margin improvement in 3Xnm DRAM contact

Sim, Hak-Yong, Yune, Hyoung-Soon, Ahn, Yeong-Bae, Moon, James, Nam, Byoung-Sub, Yim, Donggyu, Park, Sung-Ki
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Volume:
7973
Year:
2011
Language:
english
DOI:
10.1117/12.879206
File:
PDF, 350 KB
english, 2011
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