Slingram EMI Devices for Characterizing Resistive Features...

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Slingram EMI Devices for Characterizing Resistive Features Using Apparent Conductivity Measurements: check of the DualEM-421S Instrument and Field Tests

Dabas, Michel, Anest, Antoine, Thiesson, Julien, Tabbagh, Alain
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Year:
2016
Language:
english
Journal:
Archaeological Prospection
DOI:
10.1002/arp.1535
File:
PDF, 3.71 MB
english, 2016
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