Electrical characterization of metal-semiconductor-metal...

Electrical characterization of metal-semiconductor-metal structure of pseudomorphic InGaN on GaN: Simulation and experiments

Ohsawa, Jun
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Volume:
213
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201533047
Date:
June, 2016
File:
PDF, 1.95 MB
english, 2016
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