Defect-related mechanism of ferromagnetic behaviors for...

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Physica status solidi 2013 / 08

Defect-related mechanism of ferromagnetic behaviors for ZnCoO:H films formed by PLD with bias voltage application

Sasaki, Kazuma, Komiyama, Takao, Chonan, Yasunori, Yamaguchi, Hiroyuki, Aoyama, Takashi
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Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201200979
Date:
August, 2013
File:
PDF, 469 KB
english, 2013
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