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Electron transport through a metallic nanoparticle assembly embedded in SiO 2 and SiN x by low energy ion implantation
Bayle, M., Grisolia, J., Ben Assayag, G., Pecassou, B., Bonafos, C., Benzo, P., Gourbilleau, F., Carles, R.Volume:
12
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201510147
Date:
December, 2015
File:
PDF, 684 KB
english, 2015