Characterization of carrier concentration in ZnO nanowires...

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Physica status solidi 2016 / 02

Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

Wang, Lin, Guillemin, Sophie, Chauveau, Jean-Michel, Sallet, Vincent, Jomard, Francois, Brenier, Roger, Consonni, Vincent, Brémond, Georges
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Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201510268
Date:
February, 2016
File:
PDF, 389 KB
english, 2016
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