Influence of primary electron energy and take-off angle of...

Influence of primary electron energy and take-off angle of scanning electron microscopy on backscattered electron contrast of iron oxide

Aoyama, T., Nagoshi, M., Sato, K.
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Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5564
Date:
December, 2014
File:
PDF, 3.24 MB
english, 2014
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