NanoSIMS imaging alteration layers of a leached SON68 glass...

Surface and Interface Analysis 2014 / 11 Vol. 46; Iss. S1

NanoSIMS imaging alteration layers of a leached SON68 glass via a FIB-made wedged crater

Wang, Yi-Chung, Schreiber, Daniel K., Neeway, James J., Thevuthasan, Suntharampillai, Evans, James E., Ryan, Joseph V., Zhu, Zihua, Wei, Wei David
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Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5585
Date:
November, 2014
File:
PDF, 747 KB
english, 2014
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