Transformation of Arbitrary Anomaloscope Data to the C.I.E....

Transformation of Arbitrary Anomaloscope Data to the C.I.E. System of Specifications

Lakowski, R., Aspinall, P.A.
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Volume:
19
Language:
english
Journal:
Optica Acta: International Journal of Optics
DOI:
10.1080/713818594
Date:
May, 1972
File:
PDF, 344 KB
english, 1972
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