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Peak current failure levels in ESD sensitive semiconductor devices and their application in evaluation of materials used in ESD protection. Part 1: Theoretical analysis
Smallwood, Jeremy, Salmela, Hannu, Paasi, JaakkoVolume:
142
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/142/1/012056
Date:
December, 2008
File:
PDF, 466 KB
english, 2008