Development of incident x-ray flux monitor for coherent x-ray diffraction microscopy
Takahashi, Yukio, Kubo, Hideto, Furukawa, Hayato, Yamauchi, Kazuto, Matsubara, Eiichiro, Ishikawa, Tetsuya, Nishino, YoshinoriVolume:
186
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/186/1/012060
Date:
September, 2009
File:
PDF, 512 KB
english, 2009