Shanghai electron beam ion trap: design and current status

Journal of Physics Conference Series 2004 / 01 Vol. 2

Shanghai electron beam ion trap: design and current status

Xikai, Zhu, Dikui, Jiang, Panlin, Guo, Shugang, Sheng, Heping, Yan, Peirong, Gong, Naxiu, Wang, Weiguo, Shi, Yonglin, Chen, Xiangyi, Xu, Shuqing, Feng, Tuantuan, Zhou
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Volume:
2
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/2/1/009
Date:
January, 2004
File:
PDF, 793 KB
english, 2004
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