Silicon wafer characterisation by laser ultrasonics and...

Silicon wafer characterisation by laser ultrasonics and neural networks

Lefèvre, F, Jenot, F, Ouaftouh, M, Duquennoy, M, Ourak, M
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
214
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/214/1/012042
Date:
March, 2010
File:
PDF, 1.14 MB
english, 2010
Conversion to is in progress
Conversion to is failed