Intensity ratio of EUV emission lines in Fe XV studied with electron beam ion traps
Shimizu, Erina, Sakaue, Hiroyuki A, Kato, Daiji, Murakami, Izumi, Yamamoto, Norimasa, Hara, Hirohisa, Watanabe, Tetsuya, Nakamura, NobuyukiVolume:
583
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/583/1/012019
Date:
January, 2015
File:
PDF, 624 KB
english, 2015