![](/img/cover-not-exists.png)
[IEEE 2004 Conference on Computer Vision and Pattern Recognition Workshop - Washington, DC, USA (27-02 June 2004)] 2004 Conference on Computer Vision and Pattern Recognition Workshop - Combining Top-Down and Bottom-Up Segmentation
Borenstein, E., Sharon, E., Ullman, S.Year:
2004
Language:
english
DOI:
10.1109/cvpr.2004.314
File:
PDF, 776 KB
english, 2004