[IEEE 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) - Istanbul, Turkey (2016.4.12-2016.4.14)] 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) - Register file reliability enhancement through adjacent narrow-width exploitation
Ahangari, Hamzeh, Alouani, Ihsen, Ozturk, Ozcan, Niar, Smail, Rivenq, AtikaYear:
2016
Language:
english
DOI:
10.1109/dtis.2016.7483882
File:
PDF, 578 KB
english, 2016