![](/img/cover-not-exists.png)
[IEEE 1984 IEEE International Conference on Electrical Insulation - Montreal Quebec, Canada (1984.6.11-1984.6.13)] 1984 IEEE International Conference on Electrical Insulation - S.E.M. study of aging phenomena in dielectrics at cryotemperatures
Hossam-Eldin, Ahmed A.Year:
1984
Language:
english
DOI:
10.1109/eic.1984.7465190
File:
PDF, 2.98 MB
english, 1984