[IEEE 2015 IEEE 17th Electronics Packaging and Technology...

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[IEEE 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Singapore (2015.12.2-2015.12.4)] 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Study on failure mode and mechanism of bond pad under Cu ball bonding process using wire pull test and finite element modeling

Che, F. X., Wai, Leong Ching, Hsiao, Hsiang-Yao, Chai, T.C.
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Year:
2015
Language:
english
DOI:
10.1109/eptc.2015.7412385
File:
PDF, 908 KB
english, 2015
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