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[IEEE 2007 International Conference on Wavelet Analysis and Pattern Recognition - Beijing, China (2007.11.2-2007.11.4)] 2007 International Conference on Wavelet Analysis and Pattern Recognition - Research on tool failure prediction and wear monitoring based hmm pattern recognition theory
Jing Kang,, Ni Kang,, Chang-Jian Feng,, Hong-Ping Hu,Year:
2007
DOI:
10.1109/icwapr.2007.4421609
File:
PDF, 490 KB
2007