[IEEE 2016 IEEE 23rd International Conference on Software...

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[IEEE 2016 IEEE 23rd International Conference on Software Analysis, Evolution and Reengineering (SANER) - Suita (2016.3.14-2016.3.18)] 2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER) - Studying the Relation between Anti-Patterns in Design Models and in Source Code

Karasneh, Bilal, Chaudron, Michel R. V., Khomh, Foutse, Gueheneuc, Yann-Gael
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Year:
2016
Language:
english
DOI:
10.1109/saner.2016.104
File:
PDF, 227 KB
english, 2016
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