[IEEE 2016 IEEE 23rd International Conference on Software Analysis, Evolution and Reengineering (SANER) - Suita (2016.3.14-2016.3.18)] 2016 IEEE 23rd International Conference on Software Analysis, Evolution, and Reengineering (SANER) - Studying the Relation between Anti-Patterns in Design Models and in Source Code
Karasneh, Bilal, Chaudron, Michel R. V., Khomh, Foutse, Gueheneuc, Yann-GaelYear:
2016
Language:
english
DOI:
10.1109/saner.2016.104
File:
PDF, 227 KB
english, 2016