[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - Patterns of causation in accidents and other systems engineering failures
Sorenson, Diane, Marais, KarenYear:
2016
Language:
english
DOI:
10.1109/syscon.2016.7490568
File:
PDF, 303 KB
english, 2016