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FRESH: A New Test Result Extraction Scheme for Fast TSV Tests
Park, Jaeseok, Lim, Hyunyul, Kang, SunghoYear:
2016
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2016.2578883
File:
PDF, 1.05 MB
english, 2016