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SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] High-Resolution Sensors and Hybrid Systems - Performance evaluation of a high-quality TDI-CCD color scanner
Wong, Hon-Sum P., Kang, Whan-Soo, Giordano, Francis P., Yao, Ying, Blouke, Morley M., Chang, Winchyi, Thorpe, Laurence J., Khosla, Rajinder P.Volume:
1656
Year:
1992
Language:
english
DOI:
10.1117/12.135903
File:
PDF, 987 KB
english, 1992