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SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Standardized, object-oriented, 3D vision input system
Tabor, John, Fahy, Michael, Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
Language:
english
DOI:
10.1117/12.144819
File:
PDF, 434 KB
english, 1993