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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Research on profile tracing and recognition for hot-strip ends
Li, Xiong-Jun, Li, Zhu, Tang, Ling-Jing, Zhu, LiVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156371
File:
PDF, 199 KB
english, 1993