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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Quality and Reliability for Optical Systems - Employment of design of experiment for optimized development of thin film coatings
Barron, Alan C., Kennemore III, Charles M., Slomba, Albert F., Van Milligen, Fred J., Bilbro, James W., Parks, Robert E.Volume:
1993
Year:
1993
Language:
english
DOI:
10.1117/12.164980
File:
PDF, 475 KB
english, 1993