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SPIE Proceedings [SPIE Optoelectronic Science and Engineering '94: International Conference - Beijing, China (Monday 15 August 1994)] Second International Conference on Optoelectronic Science and Engineering '94 - Computed tomographic microscope: theory of microscopic CT
Chen, Wenbin, Yian, Yian, Zhang, Qiju, Li, Tongpi, Guo, Tiechen, Liu, Zhong, Qin, Huiji, Li, Daoqin, Da-Heng, Wang, Consortini, Anna, Breckinridge, James B.Volume:
2321
Year:
1994
Language:
english
DOI:
10.1117/12.182059
File:
PDF, 201 KB
english, 1994