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SPIE Proceedings [SPIE Fifth International Conference on Machine Vision (ICMV 12) - Wuhan, China (Saturday 20 October 2012)] Fifth International Conference on Machine Vision (ICMV 2012): Algorithms, Pattern Recognition, and Basic Technologies - An intelligent diagnosis model based on rough set theory
Li, Ze, Huang, Hong-Xing, Zheng, Ye-Lu, Wang, Zhou-Yuan, Wang, Yulin, Tan, Liansheng, Zhou, JianhongVolume:
8784
Year:
2013
Language:
english
DOI:
10.1117/12.2021228
File:
PDF, 193 KB
english, 2013