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SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California, United States (Saturday 1 February 2014)] Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII - Contact resistance evolution of highly cycled, lightly loaded micro-contacts
Shea, Herbert R., Ramesham, Rajeshuni, Stilson, Christopher, Coutu, RonaldVolume:
8975
Year:
2014
Language:
english
DOI:
10.1117/12.2037355
File:
PDF, 5.88 MB
english, 2014