SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, USA (Monday 5 May 2014)] Next-Generation Analyst II - Predicting student success using analytics in course learning management systems
Broome, Barbara D., Hall, David L., Llinas, James, Olama, Mohammed M., Thakur, Gautam, McNair, Allen W., Sukumar, Sreenivas R.Volume:
9122
Year:
2014
Language:
english
DOI:
10.1117/12.2050641
File:
PDF, 239 KB
english, 2014