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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] Interferometry XVII: Techniques and Analysis - Dual-wavelength diffraction phase microscopy for real-time dispersion measurement
Creath, Katherine, Burke, Jan, Schmit, Joanna, Jafarfard, Mohammad Reza, Tayebi, Behnam, Kim, Dug YoungVolume:
9203
Year:
2014
Language:
english
DOI:
10.1117/12.2061225
File:
PDF, 505 KB
english, 2014