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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - A new technique of recognition for coded targets in optical 3D measurement
Han, Sen, Yoshizawa, Toru, Zhang, Song, Guo, Changye, Cheng, Xiaosheng, Cui, Haihua, Dai, Ning, Weng, JinpingVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2070957
File:
PDF, 438 KB
english, 2014