SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] Advanced Optical Manufacturing and Testing - Noncontact precision measurement system
Gamache, Ronald, Tourtellott, John, Wagner, John F., Sanger, Gregory M., Reid, Paul B., Baker, Lionel R.Volume:
1333
Year:
1990
Language:
english
DOI:
10.1117/12.22799
File:
PDF, 297 KB
english, 1990