SPIE Proceedings [SPIE Polarimetry and Ellipsometry - Kazimierz Dolny, Poland (Monday 20 May 1996)] Polarimetry and Ellipsometry - Ellipsometry for correctly determining the void fraction and true refractive index of thin films
Tolmachev, Vladimir A., Pluta, Maksymilian, Wolinski, Tomasz R.Volume:
3094
Year:
1997
Language:
english
DOI:
10.1117/12.271828
File:
PDF, 646 KB
english, 1997