![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Uzhgorod, Ukraine (Monday 30 September 1996)] Material Science and Material Properties for Infrared Optoelectronics - Determination of diffusion lengths of minority carriers in Hg1-xCdxTe (x~0.2 to 0.3) by EBIC method
Franc, Jan, Belas, Eduard, Grill, Roman, Toth, A. L., Sitter, Helmut, Moravec, Pavel, Hoeschl, Pavel, Sizov, Fiodor F., Tetyorkin, Vladimir V.Volume:
3182
Year:
1997
Language:
english
DOI:
10.1117/12.280429
File:
PDF, 788 KB
english, 1997