SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Uzhgorod, Ukraine (Monday 30 September 1996)] Material Science and Material Properties for Infrared Optoelectronics - Determination of diffusion lengths of minority carriers in Hg1-xCdxTe (x~0.2 to 0.3) by EBIC method

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