SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Infrared Technology and Applications XXIV - Reliability assessment procedure of cryocoolers
Porat, Zvi, Sne-Or, A., Pundak, Nachman, Livni, D., Andresen, Bjorn F., Strojnik, MarijaVolume:
3436
Year:
1998
Language:
english
DOI:
10.1117/12.328031
File:
PDF, 325 KB
english, 1998