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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Optics, Instruments, and Missions - Development of beamline U3A for AXAF synchrotron reflectivity calibrations
Burek, Anthony J., Cobuzzi, J. C., Fitch, Jonathan J., Graessle, Dale E., Ingram, Russell H., Sweeney, J. B., Blake, Richard L., Francoeur, R., Sullivan, E. S., Hoover, Richard B., Walker II, Arthur BVolume:
3444
Year:
1998
Language:
english
DOI:
10.1117/12.331281
File:
PDF, 909 KB
english, 1998