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SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring - FT-IR interferogram sampling validation and correction
Manning, Christopher J., Combs, Roger J., Fallahi, Mahmoud, Nordstrom, Robert J., Todd, Terry R.Volume:
3537
Year:
1999
Language:
english
DOI:
10.1117/12.341031
File:
PDF, 333 KB
english, 1999