SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Three-Dimensional Image Capture and Applications II - 3D profilometry using a dynamically configurable confocal microscope

Cha, Sungdo, Lin, Paul C., Zhu, Lijun, Botvinick, Elliott L., Sun, Pang Chen, Fainman, Yeshaiahu, Nurre, Joseph H., Corner, Brian D.
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Volume:
3640
Year:
1999
Language:
english
DOI:
10.1117/12.341066
File:
PDF, 2.24 MB
english, 1999
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