![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE AeroSense '99 - Orlando, FL (Monday 5 April 1999)] Optical Pattern Recognition X - Digital forward error correction in optoelectronic image analysis: a case study
Krueger, Sven, Teiwes, Stephan, Gruber, Hartmut, Senoner, Mathias, Wernicke, Guenther K., Casasent, David P., Chao, Tien-HsinVolume:
3715
Year:
1999
Language:
english
DOI:
10.1117/12.341312
File:
PDF, 3.55 MB
english, 1999