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SPIE Proceedings [SPIE Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 28 September 1998)] Fourth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Strain analysis of epitaxial multivalley semiconductor films using galvanomagnetic-effect rotational dependence
Berchenko, Nicolas N., Yakovyna, Vitaliy S., Nikiforov, Alexander Y., Zogg, Hans, Sizov, Fiodor F.Volume:
3890
Year:
1999
Language:
english
DOI:
10.1117/12.368359
File:
PDF, 340 KB
english, 1999