SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Ultraviolet and X-Ray Detection, Spectroscopy, and Polarimetry III - Ultraviolet astronomical polarimetry: some results and prospects
Nordsieck, Kenneth H., Harris, Walter M., Fineschi, Silvano, Woodgate, Bruce E., Kimble, Randy A.Volume:
3764
Year:
1999
Language:
english
DOI:
10.1117/12.371078
File:
PDF, 974 KB
english, 1999