SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Devices and Diagnostics in Materials Science - High-numerical-aperture objective lenses and optical system improved objective type total internal reflection fluorescence microscopy
Kawano, Yoshihiro, Abe, Chikara, Kaneda, Teruo, Aono, Yasushi, Abe, Katsuyuki, Tamura, Keisuke, Terakawa, Susumu, Andrews, David L., Asakura, Toshimitsu, Jutamulia, Suganda, Kirk, Wiley P., Lagally, MVolume:
4098
Year:
2000
DOI:
10.1117/12.401623
File:
PDF, 1.52 MB
2000