SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Process Control and Inspection for Industry - Effect on intensity modulation caused by perpendicularity between the axes of fiber pair and reflector
Yang, Huayong, Lu, Haibao, Xu, Tao, Yan, Shuhua, Chen, Zhifeng, Zhang, Shulian, Gao, WeiVolume:
4222
Year:
2000
Language:
english
DOI:
10.1117/12.403901
File:
PDF, 155 KB
english, 2000