SPIE Proceedings [SPIE Intelligent Systems and Smart...

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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Process Imaging for Automatic Control - Effects of inaccuracies in fluid dynamical models in state estimation of process tomography

Seppanen, Aku, Vauhkonen, Marko J., Somersalo, Erkki, Kaipio, Jari P., McCann, Hugh, Scott, David M.
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Volume:
4188
Year:
2001
Language:
english
DOI:
10.1117/12.417153
File:
PDF, 834 KB
english, 2001
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